IEC - International Electrotechnical Commission - IEC PAS 62202:2000

Failure mechanisms and models for silicon semiconductor devices

withdrawn
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Organization: IEC - International Electrotechnical Commission
Publication Date: 28 November 2000
Status: withdrawn
Page Count: 35
ICS Code (Semiconductor devices in general): 31.080.01
abstract:

Provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is... View More

Document History

IEC PAS 62202:2000
November 28, 2000
Failure mechanisms and models for silicon semiconductor devices
Provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based...
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