IEC - International Electrotechnical Commission - IEC 60147-4:1976
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 4: Acceptance and reliability
withdrawn
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 1 January 1976 |
| Status: | withdrawn |
| Page Count: | 39 |
| ICS Code (Diodes): | 31.080.10 |
abstract:
Gives conditions for electrical tests, for different temperature conditions and for different durations, as well as failure-defining characteristics and failure criteria, which are standardized... View More
Document History
IEC 60147-4:1976
January 1, 1976
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 4: Acceptance and reliability
Gives conditions for electrical tests, for different temperature conditions and for different durations, as well as failure-defining characteristics and failure criteria, which are standardized for...