IEC - International Electrotechnical Commission - IEC TR 61967-1-1:2010

Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format

revised
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Organization: IEC - International Electrotechnical Commission
Publication Date: 11 May 2010
Status: revised
Page Count: 103
ICS Code (Integrated circuits. Microelectronics): 31.200
abstract:

IEC/TR 61967-1-1:2010 provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by... View More

Document History

August 28, 2015
Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
IEC TR 61967-1-1:2015(E) provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by...
IEC TR 61967-1-1:2010
May 11, 2010
Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
IEC/TR 61967-1-1:2010 provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by...
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