IEC - International Electrotechnical Commission - IEC TR 61967-1-1:2010
Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
revised
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 11 May 2010 |
| Status: | revised |
| Page Count: | 103 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
abstract:
IEC/TR 61967-1-1:2010 provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by... View More
Document History
August 28, 2015
Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
IEC TR 61967-1-1:2015(E) provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by...
IEC TR 61967-1-1:2010
May 11, 2010
Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
IEC/TR 61967-1-1:2010 provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by...