IEC - International Electrotechnical Commission - IEC PAS 61338-1-5:2010
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 19 May 2010 |
| Status: | replaced |
| Page Count: | 20 |
| ICS Code (Piezoelectric devices): | 31.140 |
abstract:
IEC/PAS 61338-1-5:2010(E) describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate.
Document History
IEC PAS 61338-1-5:2010
May 19, 2010
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
IEC/PAS 61338-1-5:2010(E) describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate.