IEC - International Electrotechnical Commission - IEC PAS 62336:2002
Accelerated Moisture Resistance - Unbiased HAST
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 15 August 2002 |
| Status: | replaced |
| Page Count: | 8 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Used to identify failure mechanisms internal to packages, the unbiased HAST aims at evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Document History
IEC PAS 62336:2002
August 15, 2002
Accelerated Moisture Resistance - Unbiased HAST
Used to identify failure mechanisms internal to packages, the unbiased HAST aims at evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.