IEC - International Electrotechnical Commission - IEC 60068-2-29:1968/AMD1:1982
amendment 1 - Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test Eb: Bump
revised
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 30 November 1982 |
| Status: | revised |
| Page Count: | 7 |
| ICS Code (Environmental testing): | 19.040 |
Document History
March 30, 1987
Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
Determines the ability of a specimen to withstand specified severities of bump. Has the status of a basic safety publication in accordance with IEC Guide 104.
September 30, 1983
Amendment 2 - Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test Eb: Bump
A description is not available for this item.
IEC 60068-2-29:1968/AMD1:1982
November 30, 1982
amendment 1 - Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test Eb: Bump
A description is not available for this item.
January 1, 1968
Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test Eb: Bump
A description is not available for this item.