IEC - International Electrotechnical Commission - IEC 60749-29:2003
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
revised
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 4 November 2003 |
| Status: | revised |
| Page Count: | 41 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to... View More
Document History
April 7, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up...
IEC 60749-29:2003
November 4, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to...