IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel approach to random pattern testing of sequential circuits

Author(s): L. Nachman ; K. Saluja ; S.J. Upadhyaya ; R. Reuse
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Distributed Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Volume: 47
Page Count: 6
Page(s): 129 - 134
ISSN (Paper): 0018-9340
DOI: 10.1109/12.656097
Regular:

Random pattern testing methods are known to result in poor fault coverage for most sequential circuits unless costly circuit modifications are made. In this paper, we propose a novel approach to... View More

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