IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1500/D11, Jan 06
IEEE Draft Standard Testability Method for Embedded Core-Based Integrated Circuits
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| Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 1 January 2006 |
| Status: | inactive |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
| ISBN (Electronic): | 978-1-5044-2467-7 |
Document History
P1500/D11, Jan 06
January 1, 2006
IEEE Draft Standard Testability Method for Embedded Core-Based Integrated Circuits
A description is not available for this item.
August 29, 2005
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
This standard defines a mechanism for the test of core designs within a system on chip (SoC). This mechanism constitutes a hardware architecture and leverages the core test language (CTL) to...