IEEE - Institute of Electrical and Electronics Engineers, Inc. - Benchmarking semiconductor manufacturing performance using a pairwise-comparison method
Author(s): | L. Sattler ; C.R. Glassey ; B.I. Saeed |
Sponsor(s): | IEEE Electron Devices Society |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 May 1997 |
Volume: | 10 |
Page Count: | 5 |
Page(s): | 317 - 321 |
ISSN (Paper): | 0894-6507 |
ISSN (Online): | 1558-2345 |
DOI: | 10.1109/66.572087 |
Regular:
Benchmarking performance against competitors is an increasingly popular activity within the semiconductor industry. Owing to the high variability in manufacturing metrics, a simple monthly metric... View More