IEEE - Institute of Electrical and Electronics Engineers, Inc. - Quick address detection of anomalous memory cells in a flash memory test structure

Author(s): T. Himeno ; H. Hazama ; T. Yaegashi ; K. Sakui ; K. Kanda ; Y. Itoh ; J. Miyamoto
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 1997
Volume: 10
Page Count: 5
Page(s): 196 - 200
ISSN (Paper): 0894-6507
ISSN (Online): 1558-2345
DOI: 10.1109/66.572068
Regular:

A novel scheme for quick address detection of anomalous memory cells having the highest and lowest threshold voltages in a flash memory test structure is described. A test structure with a large... View More

Advertisement