IEEE - Institute of Electrical and Electronics Engineers, Inc. - Finding fault with deep-submicron ICs
Author(s): | D.P. Vallett ; J.M. Soden |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 October 1997 |
Volume: | 34 |
Page Count: | 12 |
Page(s): | 39 - 50 |
ISSN (Paper): | 0018-9235 |
DOI: | 10.1109/6.625244 |
Regular:
The ability to isolate and identify subtle defects on complex chips is threatened as semiconductor technology approaches the tenth-micron realm.