IEEE - Institute of Electrical and Electronics Engineers, Inc. - Finding fault with deep-submicron ICs

Author(s): D.P. Vallett ; J.M. Soden
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 1997
Volume: 34
Page Count: 12
Page(s): 39 - 50
ISSN (Paper): 0018-9235
DOI: 10.1109/6.625244
Regular:

The ability to isolate and identify subtle defects on complex chips is threatened as semiconductor technology approaches the tenth-micron realm.

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