IEEE - Institute of Electrical and Electronics Engineers, Inc. - Finding fault with deep-submicron ICs
|Author(s):||D.P. Vallett ; J.M. Soden|
|Publisher:||IEEE - Institute of Electrical and Electronics Engineers, Inc.|
|Publication Date:||1 October 1997|
|Page(s):||39 - 50|
The ability to isolate and identify subtle defects on complex chips is threatened as semiconductor technology approaches the tenth-micron realm.