IEEE Computer Society - Open defects in CMOS RAM address decoders

Author(s): M. Sachdev
Sponsor(s): IEEE Computer Society
Publisher: IEEE Computer Society
Publication Date: 1 April 1997
Volume: 14
Page Count: 8
Page(s): 26 - 33
ISSN (Paper): 0740-7475
DOI: 10.1109/54.587738
Regular:

Field failures of embedded SRAMs led the author to identify open defects that escape detection by conventional march tests. Appropriate decoder-testing and DFT strategies can uncover these... View More

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