IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using Extended Random Set to Find Specific Patterns

2014 IEEE/WIC/ACM International Joint Conferences on Web Intelligence (WI) and Intelligent Agent Technologies (IAT)

Author(s): Mubarak Albathan ; Yuefeng Li ; Yue Xu
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2014
Conference Location: Warsaw, Poland
Conference Date: 11 August 2014
Volume: 2
Page(s): 30 - 37
ISBN (Electronic): 978-1-4799-4143-8
DOI: 10.1109/WI-IAT.2014.77
Regular:

With the overwhelming increase in the amount of data on the web and data bases, many text mining techniques have been proposed for mining useful patterns in text documents. Extracting closed... View More

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