IEEE - Institute of Electrical and Electronics Engineers, Inc. - An improved through line de-embedding method with even-odd mode measurement

2014 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)

Author(s): Oupeng Li ; Wei Cheng ; Lei Wang ; Haiyan Lu ; Ruimin Xu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2014
Conference Location: Hefei, China
Conference Date: 27 August 2014
Page(s): 1 - 3
ISBN (Electronic): 978-1-4799-5503-9
DOI: 10.1109/RFIT.2014.6933256
Regular:

This paper presents a new S-parameter matrix calculation based de-embedding methodology. In this method, a noval even-odd mode measurement is proposed to correct the error in traditional through... View More

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