IEEE - Institute of Electrical and Electronics Engineers, Inc. - A study of statistical variability-aware methods

2014 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)

Author(s): Hao Cai ; Kaikai Liu ; Lirida Alves de Barros Naviner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2014
Conference Location: Hefei, China
Conference Date: 27 August 2014
Page(s): 1 - 3
ISBN (Electronic): 978-1-4799-5503-9
DOI: 10.1109/RFIT.2014.6933246
Regular:

Conventionally circuit performance variability is analyzed with Monte-Carlo simulation and design corner analysis. On the other hand, statistical methods such as design of experiments (DoEs),... View More

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