IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on edge effect of radiographic testing for Titanium alloy joint structure with large thickness difference

2014 IEEE Far East Forum on Nondestructive Evaluation/Testing (FENDT)

Author(s): Wu Wei ; Hu Li ; Zhang Xiang-lin ; Xiao Yu-xing ; Wu Guan-hua
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2014
Conference Location: Chengdu, China
Conference Date: 20 June 2014
Page(s): 320 - 323
ISBN (CD): 978-1-4799-6286-0
ISBN (Electronic): 978-1-4799-4730-0
ISBN (Paper): 978-1-4799-4731-7
DOI: 10.1109/FENDT.2014.6928288
Regular:

This paper presents a study on edge effect of radiographic inspection for Titanium alloy joint structure with large thickness difference. And due to the existence of the defects undetected caused... View More

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