IEEE - Institute of Electrical and Electronics Engineers, Inc. - The post-processing technology of ultrasound scanning point position based on automatic programming

2014 IEEE Far East Forum on Nondestructive Evaluation/Testing (FENDT)

Author(s): Ye Huang ; Juan Hao ; Zhen Xiao ; Xinliang Li ; Zongxing Lu ; Liu Yang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2014
Conference Location: Chengdu, China
Conference Date: 20 June 2014
Page(s): 153 - 157
ISBN (CD): 978-1-4799-6286-0
ISBN (Electronic): 978-1-4799-4730-0
ISBN (Paper): 978-1-4799-4731-7
DOI: 10.1109/FENDT.2014.6928252
Regular:

With the development of non-destructive detection, higher accuracy and efficiency are required for non-destructive detection, that the mode of hand-held probe can't meet the testing requirements,... View More

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