IEEE - Institute of Electrical and Electronics Engineers, Inc. - General bad data identification and estimation in the presence of critical measurement sets

2014 IEEE PES General Meeting | Conference & Exposition

Author(s): Francesco Fusco
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2014
Conference Location: National Harbor, MD, USA
Conference Date: 27 July 2014
Page(s): 1 - 5
ISBN (Electronic): 978-1-4799-6415-4
DOI: 10.1109/PESGM.2014.6938820
Regular:

In power systems state estimation, critical sets are groups of measurements whose normalized residuals are (nearly) equal, so that corresponding bad data are not identifiable. A novel methodology... View More

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