IEEE - Institute of Electrical and Electronics Engineers, Inc. - New EMC-testing-method for smart sensors during for IC-design-process

2014 International Symposium on Electromagnetic Compatibility - EMC EUROPE

Author(s): C. Spindler
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2014
Conference Location: Gothenburg, Sweden
Conference Date: 1 September 2014
Page(s): 1,186 - 1,189
ISBN (Electronic): 978-1-4799-3226-9
ISSN (Electronic): 2325-0364
DOI: 10.1109/EMCEurope.2014.6931083
Regular:

Electronic systems generated much innovation of automotive development in recent years. The number of integrated sensor-systems is rising significantly faster compared to other electronics in... View More

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