IEEE - Institute of Electrical and Electronics Engineers, Inc. - Shape-memory alloy mechanical contact devices

Author(s): M. Braunovic ; C. Labrecque
Sponsor(s): Ericsson
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1996
Volume: 19
Page Count: 9
Page(s): 295 - 303
ISSN (Paper): 1070-9886
DOI: 10.1109/95.536830
Regular:

The effect of current cycling on the performance of bolted aluminum-to-aluminum connections employing different mechanical contract devices has been studied. Current-cycling conditions and... View More

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