IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accelerated life tests analyzed by a piecewise exponential distribution via generalized linear models

Author(s): E.P. Barbosa ; E.A. Colosimo ; F. Louzada-Neto
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1996
Volume: 45
Page Count: 5
Page(s): 619 - 623
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/24.556584
Regular:

Efficient industrial experiments for the reliability analysis of manufactured products consist of subjecting the units to accelerated life tests where, for each pre-fixed stress level, the... View More

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