IEEE - Institute of Electrical and Electronics Engineers, Inc. - Linear-spline approximation for semi-parametric modeling of failure data with proportional hazards

Author(s): R. Guo ; C.E. Love
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 1996
Volume: 45
Page Count: 6
Page(s): 261 - 266
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/24.510812
Regular:

Modeling of failure processes using proportional hazards involves estimating both a baseline failure intensity as well as the parameters of the proportional failure intensity. In the absence of... View More

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