IEEE - Institute of Electrical and Electronics Engineers, Inc. - Performance of high voltage protection cards used in digital telephone exchanges

2013 IEEE 1st International Conference on Condition Assessment Techniques in Electrical Systems (CATCON)

Author(s): B. Subba Reddy ; Alok R. Verma ; Sanjeevan Palit ; Anwesha Panda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2013
Conference Location: Kolkata, India
Conference Date: 6 December 2013
Page(s): 128 - 133
ISBN (CD): 978-1-4799-0081-7
ISBN (Electronic): 978-1-4799-0083-1
DOI: 10.1109/CATCON.2013.6737485
Regular:

Surge voltages and currents in low ac power circuits essentially occur due to natural lightning and switching phenomena. The other source of surge occurrence is probably due to the interaction of... View More

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