IEEE - Institute of Electrical and Electronics Engineers, Inc. - An inverse scattering approach for inspecting dielectric scatterers at microwave frequencies without phase information

2013 IEEE International Conference on Imaging Systems and Techniques (IST)

Author(s): Sandra Costanzo ; Giuseppe Di Massa ; Matteo Pastorino ; Andrea Randazzo
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2013
Conference Location: Beijing, China
Conference Date: 22 October 2013
Page(s): 392 - 397
ISBN (CD): 978-1-4673-5790-6
ISBN (Electronic): 978-1-4673-5791-3
DOI: 10.1109/IST.2013.6729728
Regular:

Microwave imaging techniques aim at inspecting targets by using interrogating microwaves. In recent years, several numerical inversion methods and prototypes of microwave imaging systems have been... View More

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