IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic crosstalk analysis of CMOS driven RLC interconnects using FDTD method

2013 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium)

Author(s): V. Ramesh Kumar ; B. K. Kaushik ; A. Patnaik
Sponsor(s): IEEE Ant. Propag. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2013
Conference Location: Lake Buena Vista, FL, USA
Conference Date: 7 July 2013
Page(s): 80
ISBN (CD): 978-1-4799-1128-8
ISBN (Electronic): 978-1-4799-1129-5
DOI: 10.1109/USNC-URSI.2013.6715386
Regular:

Summary form only given. The scaling of on-chip interconnect dimensions and high operating frequencies produce transient crosstalk between coupled interconnect lines. Because of this reason, the... View More

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