IEEE - Institute of Electrical and Electronics Engineers, Inc. - Ridge waveguide probe for estimation of the scattering parameters of a device at millimeter- and sub-millimeter-wave frequencies

2013 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium)

Author(s): Armin Jam ; Kamal Sarabandi
Sponsor(s): IEEE Ant. Propag. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2013
Conference Location: Lake Buena Vista, FL, USA
Conference Date: 7 July 2013
Page(s): 17
ISBN (CD): 978-1-4799-1128-8
ISBN (Electronic): 978-1-4799-1129-5
DOI: 10.1109/USNC-URSI.2013.6715323
Regular:

In this study, we investigate a novel approach for on-wafer testing of active and passive circuits at Y-band and higher. This represents an alternative approach to the conventional coaxial- or... View More

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