IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the existence of face quality measures

2013 IEEE 6th International Conference on Biometrics: Theory, Applications and Systems (BTAS)

Author(s): P. Jonathon Phillips ; J. Ross Beveridge ; David S. Bolme ; Bruce A. Draper ; Geof H. Givens ; Yui Man Lui ; Su Cheng ; Mohammad Nayeem Teli ; Hao Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2013
Conference Location: Arlington, VA, USA
Conference Date: 29 September 2013
Page(s): 1 - 8
ISBN (Electronic): 978-1-4799-0527-0
DOI: 10.1109/BTAS.2013.6712715
Regular:

We investigate the existence of quality measures for face recognition. First, we introduce the concept of an oracle for image quality in the context of face recognition. Next we introduce greedy... View More

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