IEEE - Institute of Electrical and Electronics Engineers, Inc. - Double-strand breaks on a genomic DNA caused by ultrasound: Evaluation by single DNA observation

2013 International Symposium on Micro-NanoMechatronics and Human Science (MHS)

Author(s): Takahiro Kenmotmsu ; Naoki Ogawa ; Rinko Kubota ; Kenji Yoshida ; Yukihiro Kagawa ; Yoshiaki Watanabe ; Yuko Yoshikawa ; Kenich Yoshikawa
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2013
Conference Location: Nagoya, Japan
Conference Date: 10 November 2013
Page(s): 1 - 3
ISBN (CD): 978-1-4799-1527-9
ISBN (Electronic): 978-1-4799-1529-3
DOI: 10.1109/MHS.2013.6710461
Regular:

Double-strand brakes of T4-DNA molecules caused by ultrasound irradiation are monitored through the methodology of single giant DNA observation by fluorescence microscopy. The experimental results... View More

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