IEEE - Institute of Electrical and Electronics Engineers, Inc. - High density printing paper quality investigation

9th IEEE Regional Symposium on Micro and Nanoelectronics (RSM 2013)

Author(s): O. T. Say ; Z. Sauli ; V. Retnasamy
Sponsor(s): IEEE Electron Devices Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2013
Conference Location: Langkawi, Malaysia
Conference Date: 25 September 2013
Page(s): 273 - 277
ISBN (CD): 978-1-4799-1181-3
ISBN (Electronic): 978-1-4799-1183-7
DOI: 10.1109/RSM.2013.6706528
Regular:

Light has been used to examine the quality of the products or surface finishing of most products by the industries in recent times. In this research, a lab module tester was designed and built to... View More

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