IEEE - Institute of Electrical and Electronics Engineers, Inc. - An improved classification model based on covering algorithm and SVM

2013 13th International Conference on Control, Automaton and Systems (ICCAS 2013)

Author(s): Yang Shi ; Young-Im Cho
Sponsor(s): IEEE Ind. Electron. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2013
Conference Location: Gwangju, South Korea
Conference Date: 20 October 2013
Page(s): 539 - 542
ISBN (CD): 978-89-93215-05-2
ISSN (Paper): 2093-7121
DOI: 10.1109/ICCAS.2013.6703996
Regular:

In order to overcome some shortages of SVM, an improved classification model is introduced in this paper. For the first problem about isolated points or noises mixed in training data sets which... View More

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