IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability analysis based on the statistical models method for the subway door system

2013 IEEE International Conference on Intelligent Rail Transportation (ICIRT)

Author(s): Qin Yong ; Yu Shan ; Shi Jingxuan ; Mao Lingli
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2013
Conference Location: Beijing, China
Conference Date: 30 August 2013
Page(s): 215 - 220
DOI: 10.1109/ICIRT.2013.6696296
Regular:

At present, the vehicle door system is the key subsystem to the subway vehicle faults. Therefore, its reliability is of great significance to ensure the subway safe operation. In order to analyze... View More

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