IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bayesian nonparametric reliability analysis for a railway system at component level

2013 IEEE International Conference on Intelligent Rail Transportation (ICIRT)

Author(s): Payam Mokhtarian ; Mohammad-Reza Namzi-Rad ; Tin Kin Ho ; Thomas Suesse
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2013
Conference Location: Beijing, China
Conference Date: 30 August 2013
Page(s): 197 - 202
ISBN (Electronic): 978-1-4673-5277-2
ISBN (DVD): 978-1-4673-5276-5
ISBN (Paper): 978-1-4673-5278-9
DOI: 10.1109/ICIRT.2013.6696293
Regular:

Railway system is a typical large-scale complex system with interconnected sub-systems which contain numerous components. System reliability is retained through appropriate maintenance measures... View More

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