IEEE - Institute of Electrical and Electronics Engineers, Inc. - Model-based generation of safety test-cases for Onboard systems

2013 IEEE International Conference on Intelligent Rail Transportation (ICIRT)

Author(s): Li Chenling ; Li KaiCheng ; Tang Tao ; Lv JiDong ; Huang Ling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2013
Conference Location: Beijing, China
Conference Date: 30 August 2013
Page(s): 191 - 196
DOI: 10.1109/ICIRT.2013.6696292
Regular:

As a core subsystem in CTCS-3, the Onboard subsystem is a typical safety-critical system, in which any fault can lead to huge human injury or wealth losing. It is important to guarantee the safety... View More

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