IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research and application of the BFM-STAMP hazard analysis method

2013 IEEE International Conference on Intelligent Rail Transportation (ICIRT)

Author(s): Rui Wang ; Wei Zheng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2013
Conference Location: Beijing, China
Conference Date: 30 August 2013
Page(s): 174 - 178
DOI: 10.1109/ICIRT.2013.6696289
Regular:

The traditional hazard analysis approaches applied to the socio-technical systems can not cover the complex organization structures, the interactions between systems and human behaviors, the... View More

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