IEEE - Institute of Electrical and Electronics Engineers, Inc. - Environment rematching: Toward dependability improvement for self-adaptive applications

2013 IEEE/ACM 28th International Conference on Automated Software Engineering (ASE)

Author(s): Chang Xu ; Wenhua Yang ; Xiaoxing Ma ; Chun Cao ; Jian Lu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2013
Conference Location: Silicon Valley, CA, USA
Conference Date: 11 November 2013
Page(s): 592 - 597
ISBN (Electronic): 978-1-4799-0215-6
DOI: 10.1109/ASE.2013.6693118
Regular:

Self-adaptive applications can easily contain faults. Existing approaches detect faults, but can still leave some undetected and manifesting into failures at runtime. In this paper, we study the... View More

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