IEEE - Institute of Electrical and Electronics Engineers, Inc. - Model based test validation and oracles for data acquisition systems

2013 IEEE/ACM 28th International Conference on Automated Software Engineering (ASE)

Author(s): Daniel Di Nardo ; Nadia Alshahwan ; Lionel C. Briand ; Elizabeta Fourneret ; Tomislav Nakic-Alfirevic ; Vincent Masquelier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2013
Conference Location: Silicon Valley, CA, USA
Conference Date: 11 November 2013
Page(s): 540 - 550
ISBN (Electronic): 978-1-4799-0215-6
DOI: 10.1109/ASE.2013.6693111
Regular:

This paper presents an automated, model based test validation and oracle approach for systems with complex input and output structures, such as Data Acquisition (DAQ) systems, which are common in... View More

Advertisement