IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measuring the structural complexity of feature models

2013 IEEE/ACM 28th International Conference on Automated Software Engineering (ASE)

Author(s): Richard Pohl ; Vanessa Stricker ; Klaus Pohl
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2013
Conference Location: Silicon Valley, CA, USA
Conference Date: 11 November 2013
Page(s): 454 - 464
ISBN (Electronic): 978-1-4799-0215-6
DOI: 10.1109/ASE.2013.6693103
Regular:

The automated analysis of feature models (FM) is based on SAT, BDD, and CSP - known NP-complete problems. Therefore, the analysis could have an exponential worst-case execution time. However, for... View More

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