IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application of Statistical Process Control to Software Defect Metrics: An Industry Experience Report

2013 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)

Author(s): Carla Fernandez-Corrales ; Marcelo Jenkins ; Jorge Villegas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2013
Conference Location: Baltimore, MD, USA
Conference Date: 10 October 2013
Page(s): 323 - 331
ISBN (Paper): 978-0-7695-5056-5
ISSN (Paper): 1938-6451
DOI: 10.1109/ESEM.2013.51
Regular:

Statistical Process Control (SPC) has become of great significance for software engineering organizations as more of them decide to implement quality improvement initiatives. The Capability... View More

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