IEEE - Institute of Electrical and Electronics Engineers, Inc. - How Significant is the Effect of Fault Interactions on Coverage-Based Fault Localizations?

2013 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)

Author(s): Xiaozhen Xue ; Akbar Siami Namin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2013
Conference Location: Baltimore, MD, USA
Conference Date: 10 October 2013
Page(s): 113 - 122
ISBN (Paper): 978-0-7695-5056-5
ISSN (Paper): 1938-6451
DOI: 10.1109/ESEM.2013.22
Regular:

The effectiveness of coverage-based fault localizations in the presence of multiple faults has been a major concern for the software testing research community. A commonly held belief is that the... View More

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