IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Infrared Sensor Model Based on Imaging System Test Parameter

2013 IEEE International Conference on Green Computing and Communications (GreenCom) and IEEE Internet of Things (iThings) and IEEE Cyber, Physical and Social Computing (CPSCom)

Author(s): Liu Zheng ; Mao Hongxia ; Dai Ying-hong ; Wu Jingli
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2013
Conference Location: Beijing, China
Conference Date: 20 August 2013
Page(s): 1,953 - 1,956
ISBN (Electronic): 978-0-7695-5046-6
DOI: 10.1109/GreenCom-iThings-CPSCom.2013.364
Regular:

This article presents an infrared sensor model based on test parameters. From standard geometrical planes infrared frames, some sensor parameters can be measured, such as SiTF, MTF, and noise.... View More

Advertisement