IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling Stress Using Thermal Facial Patterns: A Spatio-temporal Approach

2013 Humaine Association Conference on Affective Computing and Intelligent Interaction (ACII)

Author(s): Nandita Sharma ; Abhinav Dhall ; Tom Gedeon ; Roland Goecke
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2013
Conference Location: Geneva, Switzerland
Conference Date: 2 September 2013
Page(s): 387 - 392
ISBN (Electronic): 978-0-7695-5048-0
ISSN (Electronic): 2156-8111
ISSN (Paper): 2156-8103
DOI: 10.1109/ACII.2013.70
Regular:

Stress is a serious concern facing our world today, motivating the development of better objective understanding using non-intrusive means for stress recognition. The aim for the work was to use... View More

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