IEEE - Institute of Electrical and Electronics Engineers, Inc. - Uncertainty quantification for integrated circuits: Stochastic spectral methods

2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

Author(s): Zheng Zhang ; Ibrahim Abe M. Elfadel ; Luca Daniel
Sponsor(s): IEEE Counc. Electron. Design Autom.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2013
Conference Location: San Jose, CA, USA
Conference Date: 18 November 2013
Page(s): 803 - 810
ISBN (Electronic): 978-1-4799-1071-7
ISSN (Electronic): 1558-2434
ISSN (Paper): 1092-3152
DOI: 10.1109/ICCAD.2013.6691205
Regular:

Due to significant manufacturing process variations, the performance of integrated circuits (ICs) has become increasingly uncertain. Such uncertainties must be carefully quantified with efficient... View More

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