IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scalable and efficient analog parametric fault identification

2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

Author(s): Mustafa Berke Yelten ; Suriyaprakash Natarajan ; Bin Xue ; Prashant Goteti
Sponsor(s): IEEE Counc. Electron. Design Autom.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2013
Conference Location: San Jose, CA, USA
Conference Date: 18 November 2013
Page(s): 387 - 392
ISBN (Electronic): 978-1-4799-1071-7
ISSN (Paper): 1092-3152
DOI: 10.1109/ICCAD.2013.6691147
Regular:

Analog circuits embedded in large mixed-signal designs can fail due to unexpected process parameter excursions. To evaluate manufacturing tests in terms of their ability to detect such failures,... View More

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