IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic test pattern generation for delay defects using timed characteristic functions

2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

Author(s): Shin-Yann Ho ; Shuo-Ren Lin ; Ko-Lung Yuan ; Chien-Yen Kuo ; Kuan-Yu Liao ; Jie-Hong R. Jiang ; Chien-Mo Li
Sponsor(s): IEEE Counc. Electron. Design Autom.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2013
Conference Location: San Jose, CA, USA
Conference Date: 18 November 2013
Page(s): 91 - 98
ISBN (Electronic): 978-1-4799-1071-7
ISSN (Electronic): 1558-2434
ISSN (Paper): 1092-3152
DOI: 10.1109/ICCAD.2013.6691103
Regular:

Testing integrated circuits under delay defects becomes an essential quality control step in nanometer fabrication technologies, which encounter inevitable process variations. Prior methods on... View More

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