European Microwave Association - Speeding up N-port VNA calibration eliminating one-port calibrations

2013 European Microwave Conference (EuMC)

Author(s): Frans Verbeyst ; Marc Vanden Bossche
Publisher: European Microwave Association
Publication Date: 1 October 2013
Conference Location: Nuremberg, Germany
Conference Date: 6 October 2013
Page(s): 448 - 451
ISBN (Electronic): 978-2-87487-031-6
DOI: 10.23919/EuMC.2013.6686688

With the advent of new RF devices which have an increasing number of ports and to provide the opportunity to simultaneously test several devices in production, there is a growing need for Vector... View More