IEEE - Institute of Electrical and Electronics Engineers, Inc. - A 3x blind ADC-based CDR

2013 IEEE Asian Solid-State Circuits Conference (A-SSCC)

Author(s): M. Sadegh Jalali ; Clifford Ting ; Behrooz Abiri ; Ali Sheikholeslami ; Masaya Kibune ; Hirotaka Tamura
Sponsor(s): IEEE Solid-State Circuits Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2013
Conference Location: Singapore, Singapore
Conference Date: 11 November 2013
Page(s): 349 - 352
ISBN (Electronic): 978-1-4799-0280-4
ISBN (Paper): 978-1-4799-0277-4
DOI: 10.1109/ASSCC.2013.6691054
Regular:

This paper uses a 3-bit ADC to blindly sample the received data at 3× the baud rate to recover the data. By moving from 2× to 3× sampling, we reduce the required ADC resolution from 5-bit to... View More

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