IEEE - Institute of Electrical and Electronics Engineers, Inc. - Pulse width controlled PLL/DLL using soft thermometer code

2013 IEEE Asian Solid-State Circuits Conference (A-SSCC)

Author(s): Toru Nakura ; Kunihiro Asada
Sponsor(s): IEEE Solid-State Circuits Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2013
Conference Location: Singapore, Singapore
Conference Date: 11 November 2013
Page(s): 345 - 348
ISBN (Electronic): 978-1-4799-0280-4
ISBN (Paper): 978-1-4799-0277-4
DOI: 10.1109/ASSCC.2013.6691053
Regular:

This paper demonstrates pulse width controlled PLL and DLL using a soft thermometer code. The oscillation frequency control in the PLL and the delay control in the DLL are conducted by a mostly... View More

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