IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deep trench capacitor based step-up and step-down DC/DC converters in 32nm SOI with opportunistic current borrowing and fast DVFS capabilities

2013 IEEE Asian Solid-State Circuits Conference (A-SSCC)

Author(s): Ayan Paul ; Dong Jiao ; Sachin Sapatnekar ; Chris H. Kim
Sponsor(s): IEEE Solid-State Circuits Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2013
Conference Location: Singapore, Singapore
Conference Date: 11 November 2013
Page(s): 49 - 52
ISBN (Electronic): 978-1-4799-0280-4
ISBN (Paper): 978-1-4799-0277-4
DOI: 10.1109/ASSCC.2013.6690979
Regular:

A switched capacitor step-down converter fabricated in 32nm CMOS achieves a 5X improvement in response time for fast dynamic voltage and frequency scaling (DVFS). We also present a step-up... View More

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