IEEE - Institute of Electrical and Electronics Engineers, Inc. - Coincidental correctness: An interference or interface to successful fault localization?

2013 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)

Author(s): Zheng Zheng ; Yichao Gao ; Peng Hao ; Zhenyu Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2013
Conference Location: Pasadena, CA, USA
Conference Date: 4 November 2013
Page(s): 114 - 119
ISBN (Electronic): 978-1-4799-2552-0
DOI: 10.1109/ISSREW.2013.6688889
Regular:

In software debugging, statistical fault localization techniques contrast dynamic spectra of program elements to estimate the location of faults in faulty programs. Coincidental correctness may... View More

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